Tancorre, V.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

[IEEE 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Cluj-Napoca, Romania (2019.4.24-2019.4.26)] 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

Almeida, F., Bernardi, P., Calabrese, D., Restifo, M., Reorda, M. Sonza, Appello, D., Pollaccia, G., Tancorre, V., Ugioli, R., Zoppi, G.

Year:

2019

Language:

english

File:

PDF, 473 KB

english, 2019

2

Understanding yield losses in logic circuits

Appello, D., Fudoli, A., Giarda, K., Tancorre, V., Gizdarski, E., Mathew, B.

Journal:

IEEE Design & Test of Computers

Year:

2004

Language:

english

File:

PDF, 368 KB

english, 2004

3

[IEEE 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Berlin, Germany (2009.05.10-2009.05.12)] 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Advances on yield learning through concurrent evaluation of design and process data

Appello, Davide, Tancorre, Vincenzo, Suzor, Christophe, Hall, Michael, Talluto, Salvatore, Kekare, Sagar A.

Year:

2009

Language:

english

File:

PDF, 634 KB

english, 2009

4

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Optimized embedded memory diagnosis

Carvalho, M. de, Bernardi, P., Reorda, M. Sonza, Campanelli, N., Kerekes, T., Appello, D., Barone, M., Tancorre, V., Terzi, M.

Year:

2011

Language:

english

File:

PDF, 1.53 MB

english, 2011

5

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Embedded Memory Diagnosis: An Industrial Workflow

Appello, Davide, Tancorre, Vincenzo, Bernardi, Paolo, Grosso, Michelangelo, Rebaudengo, Maurizio, Reorda, Matteo

Year:

2006

Language:

english

File:

PDF, 365 KB

english, 2006

6

[IEEE 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Stresa, Italy (2007.06.11-2007.06.12)] 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level

Appello, Davide, Tancorre, Vincenzo

Year:

2007

Language:

english

File:

PDF, 293 KB

english, 2007

7

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Exploiting programmable bist for the diagnosis of embedded memory cores

Appello, D., Bernardi, P., Fudoli, A., Rebaudengo, M., Reorda, M.S., Tancorre, V., Violante, M.

Year:

2003

Language:

english

File:

PDF, 726 KB

english, 2003

8

[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Rapid root cause analysis and process change validation with design-centric volume diagnostics in production yield enhancement

Appello, Davide, Tancorre, Vincenzo, Gomez, Jacky, Rosi, Daniele Li, Suzor, Christophe, Kekare, Sagar A.

Year:

2010

Language:

english

File:

PDF, 1.02 MB

english, 2010

9

[IEEE 2011 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2011.05.16-2011.05.18)] 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Embedded memory fail analysis for production yield enhancement

Baltagi, Youssef, Rosi, Daniele Li, Tancorre, Vincenzo, Garagnon, Christophe, Faehn, Eric, Barone, Mario, Appello, Davide, Suzor, Christophe

Year:

2011

Language:

english

File:

PDF, 939 KB

english, 2011

10

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques

D. Appello, A. Fudoli, V. Tancorre, P. Bernardi, F. Corno, M. Rebaudengo, M. Sonza Reorda

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 133 KB

english, 2004

11

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques

Appello, D., Fudoli, A., Tancorre, V., Corno, F., Rebaudengo, M., Sonza Reorda, M.

Year:

2002

Language:

english

File:

PDF, 361 KB

english, 2002

12

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - On the Automation of the Test Flow of Complex SoCs

Appello, D., Tancorre, V., Bernardi, P., Grosso, M., Rebaudengo, M., Reorda, M.S.

Year:

2006

Language:

english

File:

PDF, 375 KB

english, 2006

13

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Yield analysis of logic circuits

Appello, D., Fudoli, A., Giarda, K., Gizdarski, E., Mathew, B., Tancorre, V.

Year:

2004

Language:

english

File:

PDF, 1.54 MB

english, 2004

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски